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Development of chemometric models using Vis-NIR and Raman spectral data fusion for assessment of infant formula storage temperature and time
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2021-01
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Xiao Wang, Carlos Esquerre, Gerard Downey, Lisa Henihan, Donal O'Callaghan, Colm O'Donnell, Development of chemometric models using Vis-NIR and Raman spectral data fusion for assessment of infant formula storage temperature and time, Innovative Food Science & Emerging Technologies, Volume 67, 2021, 102551, ISSN 1466-8564, https://doi.org/10.1016/j.ifset.2020.102551.
Abstract
This study evaluated the potential of Vis-NIR and Raman spectral data fusion combined with PLS and SVM chemometric models developed using a large dataset (n = 1700) of commercial infant formula (IF) samples to (i) discriminate between different IF storage temperature (20, 37 °C) and (ii) predict IF storage time (0–12 months). Three interval-based PLS variable selection methods (forward interval PLS (FiPLS), backward interval PLS (BiPLS) and synergy interval PLS (SiPLS)) and SVM-recursive feature elimination (SVM-RFE) methods were compared for model development. The best IF storage temperature discrimination model was developed using SVM classification (SVMC) and Vis-NIR spectra (400–2498 nm) (AccuracyCV = 99.82%, AccuracyP = 100%). SVM regression (SVMR) models developed using medium level data fusion (features selected by SVM-RFE) had the lowest root mean square error (RMSE) values for IF samples stored at either temperature, 20 °C or 37 °C (RMSECV = 0.7–0.8, RMSEP = 0.6–0.9).
Industrial relevance
Spectroscopic technologies, including Vis-NIR and Raman spectroscopy have been widely applied for process analysis and increasingly for on-line process monitoring in areas of chemicals, food processing, agriculture and pharmaceuticals, etc. Due to their rapid measurement and minimal or no sample preparation, they are highly suitable for in-line process monitoring. This study demonstrates that Vis-NIR and Raman process analytical tools either individually or combined may be employed for quality assessment and process control of IF manufacture.